LEAD FRAME FOR SEMICONDUCTOR DEVICE

PROBLEM TO BE SOLVED: To prevent deterioration in the wire bonding property and solder wettability by forming a first Ni intermediate layer, second Co intermediate layer and Pd top layer in this order on a lead frame preform. SOLUTION: After degreasing and activating the surface of a Cu alloy lead f...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: SERIZAWA SEIICHI, IGAWA MASAHIRO
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:PROBLEM TO BE SOLVED: To prevent deterioration in the wire bonding property and solder wettability by forming a first Ni intermediate layer, second Co intermediate layer and Pd top layer in this order on a lead frame preform. SOLUTION: After degreasing and activating the surface of a Cu alloy lead frame preform 1, its entire surface is plated with Ni or Ni alloy to form a first intermediate layer 2 of 1μm, Co or a Co alloy of 0.05μm thickness plating is applied on the first layer 2 to form a second intermediate layer 3, and Pd or Pd alloy plated top layer 4 of 0.1μm thickness is formed on the second layer 3. Finally it is heat treated to provide a superior wire bonding property and solder wettability, without needing the high cost Au plating.