METHOD AND APPARATUS FOR DETECTING FINE LINEAR DEFECT

PROBLEM TO BE SOLVED: To highly accurately extract a linear defect without changing parameters for each extraction of an object. SOLUTION: A method for detecting a fine linear defect from an image with an object to be detected picked up comprises steps of performing normalization processing on an im...

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Bibliographische Detailangaben

Hauptverfasser:	MISONO SHOHEI, DEGAWA SADAO, KONO YUKIHIRO
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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