LIQUID CRYSTAL DISPLAY DEVICE

PROBLEM TO BE SOLVED: To measure the connection resistance value of an electric conductive material without being affected by the resistance of other wiring layers, etc., by providing a couple of terminals for measurement which constitute an electric path having a conductive material interposed as t...

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Bibliographische Detailangaben
Hauptverfasser:	NAKAYAMA TAKANORI, NATORI MASATAKA, FURUYA MASAMITSU
Format:	Patent
Sprache:	eng
Schlagworte:	DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING FREQUENCY-CHANGING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES NON-LINEAR OPTICS OPTICAL ANALOGUE/DIGITAL CONVERTERS OPTICAL LOGIC ELEMENTS OPTICS PHYSICS TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF TESTING
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To measure the connection resistance value of an electric conductive material without being affected by the resistance of other wiring layers, etc., by providing a couple of terminals for measurement which constitute an electric path having a conductive material interposed as to an electrode connected to the conductive material and a terminal for measurement which constitutes an electric path having the conductive material interposed in addition to an external terminal connected to the conductive material. SOLUTION: As for the electrode connected to the conductive material AGP, the couple of measurement terminals (1) and (2) having the conductive material AGP interposed and the measurement terminal (3) which forms the electric path having the conductive AGP interposed in addition to the external terminal (4) connected to the conductive material AGP are provided. In this liquid crystal display device, while a certain voltage is applied to two out of those terminals (1) to (4), a current flowing between the remaining two terminals is measured. Consequently, only the connection resistance value of the conductive AGP can be calculated.