SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE

PROBLEM TO BE SOLVED: To evaluate and analyze voltage dependency and the like easily and for a short time by changing arbitrarily a sense level even if it is a product after completion of assembling. SOLUTION: When assembling is finished and voltage dependency and the like of a memory being a produc...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	YONO TERU, TAKAHASHI YASUSHI
Format:	Patent
Sprache:	eng
Schlagworte:	INFORMATION STORAGE MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS STATIC STORES TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!