SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE

PROBLEM TO BE SOLVED: To evaluate and analyze voltage dependency and the like easily and for a short time by changing arbitrarily a sense level even if it is a product after completion of assembling. SOLUTION: When assembling is finished and voltage dependency and the like of a memory being a produc...

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Bibliographische Detailangaben
Hauptverfasser: YONO TERU, TAKAHASHI YASUSHI
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:PROBLEM TO BE SOLVED: To evaluate and analyze voltage dependency and the like easily and for a short time by changing arbitrarily a sense level even if it is a product after completion of assembling. SOLUTION: When assembling is finished and voltage dependency and the like of a memory being a product are evaluated and analyzed, WCBR (write/ column address strobe before/row address strobe) and an address signal ADD are inputted from an external pin, and the prescribed test signals C1-C7 are inputted to a level sensor 15 based on the address signal ADD. The level sensor 15 is provided in sense level changing sections 18-24, and a sense level is changed arbitrarily by adjusting the number connected to a node (a) by a transistor of which one side of connection parts and a gate are connected to a switching part, the other part of connection parts is connected to a ground potential Vss based on the address signal ADD.