SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
PROBLEM TO BE SOLVED: To evaluate and analyze voltage dependency and the like easily and for a short time by changing arbitrarily a sense level even if it is a product after completion of assembling. SOLUTION: When assembling is finished and voltage dependency and the like of a memory being a produc...
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| creator | YONO TERU TAKAHASHI YASUSHI |
| description | PROBLEM TO BE SOLVED: To evaluate and analyze voltage dependency and the like easily and for a short time by changing arbitrarily a sense level even if it is a product after completion of assembling. SOLUTION: When assembling is finished and voltage dependency and the like of a memory being a product are evaluated and analyzed, WCBR (write/ column address strobe before/row address strobe) and an address signal ADD are inputted from an external pin, and the prescribed test signals C1-C7 are inputted to a level sensor 15 based on the address signal ADD. The level sensor 15 is provided in sense level changing sections 18-24, and a sense level is changed arbitrarily by adjusting the number connected to a node (a) by a transistor of which one side of connection parts and a gate are connected to a switching part, the other part of connection parts is connected to a ground potential Vss based on the address signal ADD. |
| format | Patent |
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SOLUTION: When assembling is finished and voltage dependency and the like of a memory being a product are evaluated and analyzed, WCBR (write/ column address strobe before/row address strobe) and an address signal ADD are inputted from an external pin, and the prescribed test signals C1-C7 are inputted to a level sensor 15 based on the address signal ADD. The level sensor 15 is provided in sense level changing sections 18-24, and a sense level is changed arbitrarily by adjusting the number connected to a node (a) by a transistor of which one side of connection parts and a gate are connected to a switching part, the other part of connection parts is connected to a ground potential Vss based on the address signal ADD.</description><edition>6</edition><language>eng</language><subject>INFORMATION STORAGE ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; STATIC STORES ; TESTING</subject><creationdate>1998</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19980925&DB=EPODOC&CC=JP&NR=H10255499A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19980925&DB=EPODOC&CC=JP&NR=H10255499A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>YONO TERU</creatorcontrib><creatorcontrib>TAKAHASHI YASUSHI</creatorcontrib><title>SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE</title><description>PROBLEM TO BE SOLVED: To evaluate and analyze voltage dependency and the like easily and for a short time by changing arbitrarily a sense level even if it is a product after completion of assembling. SOLUTION: When assembling is finished and voltage dependency and the like of a memory being a product are evaluated and analyzed, WCBR (write/ column address strobe before/row address strobe) and an address signal ADD are inputted from an external pin, and the prescribed test signals C1-C7 are inputted to a level sensor 15 based on the address signal ADD. The level sensor 15 is provided in sense level changing sections 18-24, and a sense level is changed arbitrarily by adjusting the number connected to a node (a) by a transistor of which one side of connection parts and a gate are connected to a switching part, the other part of connection parts is connected to a ground potential Vss based on the address signal ADD.</description><subject>INFORMATION STORAGE</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>STATIC STORES</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1998</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFAPdvX1dPb3cwl1DvEPUvD0C3F1D3IMcXVRcPYMcg71DFFwcQ3zdHblYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxXgEehgZGpqYmlpaOxsSoAQABeyQ_</recordid><startdate>19980925</startdate><enddate>19980925</enddate><creator>YONO TERU</creator><creator>TAKAHASHI YASUSHI</creator><scope>EVB</scope></search><sort><creationdate>19980925</creationdate><title>SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE</title><author>YONO TERU ; TAKAHASHI YASUSHI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JPH10255499A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1998</creationdate><topic>INFORMATION STORAGE</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>STATIC STORES</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>YONO TERU</creatorcontrib><creatorcontrib>TAKAHASHI YASUSHI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>YONO TERU</au><au>TAKAHASHI YASUSHI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE</title><date>1998-09-25</date><risdate>1998</risdate><abstract>PROBLEM TO BE SOLVED: To evaluate and analyze voltage dependency and the like easily and for a short time by changing arbitrarily a sense level even if it is a product after completion of assembling. SOLUTION: When assembling is finished and voltage dependency and the like of a memory being a product are evaluated and analyzed, WCBR (write/ column address strobe before/row address strobe) and an address signal ADD are inputted from an external pin, and the prescribed test signals C1-C7 are inputted to a level sensor 15 based on the address signal ADD. The level sensor 15 is provided in sense level changing sections 18-24, and a sense level is changed arbitrarily by adjusting the number connected to a node (a) by a transistor of which one side of connection parts and a gate are connected to a switching part, the other part of connection parts is connected to a ground potential Vss based on the address signal ADD.</abstract><edition>6</edition><oa>free_for_read</oa></addata></record> |
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| subjects | INFORMATION STORAGE MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS STATIC STORES TESTING |
| title | SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE |
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