X-RAY MASK AND MANUFACTURE THEREOF

PROBLEM TO BE SOLVED: To make largest the contact between alignment signals, which are generated from an alignment mark, by a method wherein the alignment mark is formed on a membrane on the part of an alignment window and the membrane part excluded the alignment mark part is removed to form a throu...

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Bibliographische Detailangaben
Hauptverfasser: YOO HYUNG JOUN, KIN HOYU, ZEN EICHIN, SAI SOSHU
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To make largest the contact between alignment signals, which are generated from an alignment mark, by a method wherein the alignment mark is formed on a membrane on the part of an alignment window and the membrane part excluded the alignment mark part is removed to form a through hole. SOLUTION: A selected part of an X-ray absorber is removed in an electron beam lithography process and a anisotropic etching process. Photoresists 130 are respectively applied on the upper part of a first X-ray transmission body 12 and the upper part of a second X-ray transmission body 13. The photoresists 130 are patterned in such a way that the transmission body 12 of the part of an alignment window 15R and the transmission body 13 of the parts of a main chip window 14R and the window 15R are exposed. Exposed parts of the transmission bodies 12 and 13 are removed using the photoresists 130 as etching masks. A mask substrate 11 is etched until the transmission body 12 is exposed using the patterned photoresists 130 as etching masks.