DISTANCE SENSOR DEVICE

PROBLEM TO BE SOLVED: To effect distance measurement of high resolution and high precision without using a position detection element. SOLUTION: A laser beam is scanned in the direction of an x-axis by oscillating an oscillator 16 mounting a semiconductor laser 12. The semiconductor 12 and a pinhole...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
1. Verfasser:	TOTANI HIROMI
Format:	Patent
Sprache:	eng
Schlagworte:	ANALOGOUS ARRANGEMENTS USING OTHER WAVES DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES GYROSCOPIC INSTRUMENTS LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION ORRERADIATION OF RADIO WAVES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING DISTANCES, LEVELS OR BEARINGS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICALDEVICES MICROSTRUCTURAL TECHNOLOGY NAVIGATION PERFORMING OPERATIONS PHOTOGRAMMETRY OR VIDEOGRAMMETRY PHYSICS RADIO DIRECTION-FINDING RADIO NAVIGATION SURVEYING TESTING TRANSPORTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To effect distance measurement of high resolution and high precision without using a position detection element. SOLUTION: A laser beam is scanned in the direction of an x-axis by oscillating an oscillator 16 mounting a semiconductor laser 12. The semiconductor 12 and a pinhole 84 are disposed along the direction of the x-axis. Positive reflection light from a face to be measured 2 enters a light receiving element 156 via the pinhole 84. On one reciprocal scanning, reflection light enters the light receiving element 156 two times. Since the incident time interval of two incident beams is changed in response to a distance L up to the face to be measured 2, the distance L can be found by measuring the time interval.