INSPECTION METHOD FOR MULTILAYER BOARD
PROBLEM TO BE SOLVED: To provide an inspection method for a multilayer board, in which inspection high in productivity can be carried out. SOLUTION: In a test coupon 1 equipped with a plurality of small pieces for inspection oblong in the shape in plane direction, a plurality of small pieces 2 for i...
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Format: | Patent |
Sprache: | eng |
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Zusammenfassung: | PROBLEM TO BE SOLVED: To provide an inspection method for a multilayer board, in which inspection high in productivity can be carried out. SOLUTION: In a test coupon 1 equipped with a plurality of small pieces for inspection oblong in the shape in plane direction, a plurality of small pieces 2 for inspection are made, being arranged in a line in the direction (x) of the line made by the extension of one side each so that the line made by extension of one side each may accord with one another or parallel with one another. Using a test coupon 1 where the plural small pieces 2 for inspection are made so that each length in (x) direction where they are drawn up in a line may be different, the small pieces 2a and 2b for inspection where the interval between the line made by the extension, in the direction (y) of the thickness of the multilayer board, of one side 3a of the cross section of the small piece 2a for inspection in one layer and the line made by the extension, in the direction (y) of the thickness of the board, of the opposite side 3b of cross section of the small piece 2b for inspection of the test coupon 1b in the other layer is small is detected, and the slippage is inspected, using the length of the detected small pieces 2a and 2b for inspection. |
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