SCANNING ELECTRON MICROSCOPE

PROBLEM TO BE SOLVED: To easily find out the sample or a portion to be observed by disposing mirrors on an electron gun side, around a sample stage and under a sample stage, and catching the optical entire images of the sample and the sample stage viewed from an electron gun by means of a camera dis...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	NAKAZONO RYUICHI
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY
Online-Zugang:	Volltext bestellen
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