CANTILEVER HOLDER FOR SCANNING PROBE MICROSCOPE AND HOLDER MOUNT

CANTILEVER HOLDER FOR SCANNING PROBE MICROSCOPE AND HOLDER MOUNT

PROBLEM TO BE SOLVED: To provide a cantilever holder which houses and protects a cantilever until the cantilever is set at a predetermined location and to provide a holder mount which sets the cantilever at the predetermined location at the time when the cantilever holder is installed. SOLUTION: A c...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: AIZAKI SHINICHIROU
Format: Patent
Sprache:eng
Schlagworte:
APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM]
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
SCANNING-PROBE TECHNIQUES OR APPARATUS
TESTING
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Beschreibung
Zusammenfassung:PROBLEM TO BE SOLVED: To provide a cantilever holder which houses and protects a cantilever until the cantilever is set at a predetermined location and to provide a holder mount which sets the cantilever at the predetermined location at the time when the cantilever holder is installed. SOLUTION: A cantilever holder 24 is provided with a cantilever protecting member 4 which can be installed on the holder mount 26 of a scanning probe microscope(SPM) and an elastic freely-deformable blade spring 6 which holds the cantilever so that the cantilever may be housed and protected in the cantilever protecting member until the cantilever is set at the predetermined location in the SPM. The holder mount is provided with a mount part 18 on which the cantilever holder can be detachably installed and a pressing part 20 which presses the blade spring to extrude the cantilever out of the cantilever protecting member so as to set the cantilever at the predetermined location in the SPM at the time when the cantilever holder is installed on the mount part.