PLASMA PROCESSING DEVICE

PROBLEM TO BE SOLVED: To provide a plasma processing device capable of uniform processing. SOLUTION: Via a first shield member 160 and a dielectric member 158 in an opening 102b, a substantially circular high-frequency antenna 156 is provided by one round only. A capacitance of a variable capacitor...

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Bibliographische Detailangaben
Hauptverfasser: KOSHIISHI AKIRA, OYABU ATSUSHI
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:PROBLEM TO BE SOLVED: To provide a plasma processing device capable of uniform processing. SOLUTION: Via a first shield member 160 and a dielectric member 158 in an opening 102b, a substantially circular high-frequency antenna 156 is provided by one round only. A capacitance of a variable capacitor connected to a grounding side is adjusted such that a serial co-oscillation is generated at a neutral point of this high-frequency antenna 156. With such an arrangement, a desired electric field is generated in a plasma generation space, and a high- density plasma can be generated. A power supply member 126 is formed so as to have a contour in which a sectional shape in that substantially vertical direction is expressed by a given exponential function. Consequently, high-frequency power can be supplied to a top electrode 124 without generating insulation destruction or high-frequency power attenuation or the like.