SEMICONDUCTOR INTEGRATED CIRCUIT

PROBLEM TO BE SOLVED: To improve the precision of an AD converter test with the voltage which is controlled by a voltage division ratio to have a high precision. SOLUTION: Test circuits are provided in terminals Ain and Ref(+) of an AD converter 6. The test circuit on the side of the terminal Ain is...

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Bibliographische Detailangaben
1. Verfasser:	HORIE TETSUO
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS BASIC ELECTRONIC CIRCUITRY CODE CONVERSION IN GENERAL CODING DECODING ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To improve the precision of an AD converter test with the voltage which is controlled by a voltage division ratio to have a high precision. SOLUTION: Test circuits are provided in terminals Ain and Ref(+) of an AD converter 6. The test circuit on the side of the terminal Ain is provided with resistance elements 11 and 12 for (V11-V12) voltage division and transfer gates 8 and 13. A voltage division output Vit1 becomes V11+(V11-V12)/100 and is a voltage having 1/100 precision of (V11-V12). When the gate 8 is turned off and the gate 13 is turned on, the AD converter 6 is operated with the high- precision voltage Vit1. The test circuit on the side of the reference voltage input terminal has the same constitution. Thus, the test with a precision higher than the precision of a power source for AD converter test is performed though the precision of this power source is low.