SEMICONDUCTOR INTEGRATED CIRCUIT

PROBLEM TO BE SOLVED: To provide a technique whereby DC characteristics of an external pin in a free state can be measured. SOLUTION: The circuit is provided with a switch 17. When contracted data contracted by a contraction circuit 15 can be output via a preset external pin P3, the switch 17 can co...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	TAKAHASHI TADASHI, TAKAMOTO NOBUO, FURUKI AKIRA
Format:	Patent
Sprache:	eng
Schlagworte:	INFORMATION STORAGE MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS STATIC STORES TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide a technique whereby DC characteristics of an external pin in a free state can be measured. SOLUTION: The circuit is provided with a switch 17. When contracted data contracted by a contraction circuit 15 can be output via a preset external pin P3, the switch 17 can connect the other external pin P0, P1, P2 to the external pin P3 used to output the contracted data by the contraction means outside. DC characteristics of the external pin other than the external pin used output contracted data can be tested in the same connection state as when a function test is executed.