METHOD FOR EXCITING ELECTRON MICROSCOPE

PROBLEM TO BE SOLVED: To reduce the sample drift at the time of next start after concluding the use of an electron microscope. SOLUTION: When concluding the use of an electron microscope, an operator pushes a non-use time button of an input device 6. At this stage, a control device 5 commands a powe...

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Bibliographische Detailangaben
1. Verfasser: HONDA TOSHIKAZU
Format: Patent
Sprache:eng
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