PATTERN DATA ADRESS RETRIEVAL-DISPLAY DEVICE OF TEST PATTERN FOR LSI TESTER

PROBLEM TO BE SOLVED: To enable simply assign pattern address, by extracting timing set information from a test program, forming a pattern address complementary table, forming waveform data base, and displaying a waveform. SOLUTION: A timing set information forming part 110 extracts and forms timing set information from a test program. A test pattern processing part 120 releases compression when the test pattern in compressed, and forms an uncompressed data file A pattern address complementary table forming part 130 forms a pattern address complementary table from the uncompressed data file. A waveform data base forming part forms waveform data base from the uncompressed data file and the address complementary table. A waveform display part 150 displays the waveform data base along a time axis, and displays the address of a corresponding test pattern. It is possible to know, from the display, the address of the test pattern corresponding to a designated waveform, by selectively designating the waveform shown in the display part 150.