SEMICONDUCTOR STORAGE

PROBLEM TO BE SOLVED: To inspect the redundant memory cell without any destruction and to find the failure of the redundant memory cell before redundancy processing and hence improve the success rate for rescuing a defective memory cell. SOLUTION: A redundancy memory forced section circuit 10 is pro...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	YAMAMURA YASUSHI
Format:	Patent
Sprache:	eng
Schlagworte:	INFORMATION STORAGE PHYSICS STATIC STORES
Online-Zugang:	Volltext bestellen
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