CIRCUIT AND METHOD FOR TESTING OF SEMICONDUCTOR MEMORY DEVICE

PROBLEM TO BE SOLVED: To make the test of a memory of a high band width possible with a test equipment having a low band width by adding a frequency multiplier and a test control unit to the test equipment of the low band width to control it. SOLUTION: This test circuit is provided with the frequenc...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	CHO HIDEHITO, BOKU TETSUYUU
Format:	Patent
Sprache:	eng
Schlagworte:	INFORMATION STORAGE MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS STATIC STORES TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!