METHOD AND DEVICE FOR MEASURING OPTICAL CHARACTERISTIC OF TRANSPARENCE-REFLECTIVITY AND/OR REFLECTIVE OBJECT

PROBLEM TO BE SOLVED: To avoid the measuring artifact being influenced temporally in the aspects of both long time and short time instability by determining a reflectance curve according to a specified formula. SOLUTION: A reflection curve β(λ) is measured by spectrophotometry and then processed/eva...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	BUERUNAA RENTSU, YURUGEN GOOBERU, PEETAA KATSUPERU, URURITSUHI BASURAA, BUARUTAA MIYURAA, KURISUTEIAN SHIEEFUAA, IENSU MONTORI, BUIRUHERUMU SHIEEBESUTA
Format:	Patent
Sprache:	eng
Schlagworte:	COLORIMETRY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To avoid the measuring artifact being influenced temporally in the aspects of both long time and short time instability by determining a reflectance curve according to a specified formula. SOLUTION: A reflection curve β(λ) is measured by spectrophotometry and then processed/evaluated by a computer 17 in order to determine the color value. In order to measure the curve β(λ), a part of the surface 22a of an object is irradiated locally by a light source 4 an the light reflected on the surface 22a is subjected to spectral factorization by means of a light scattering unit 14 before the intensity is measured by means of a light receiving unit 15. Consequently, the curve β(λ) is determined according to a formula. (βp (λ)= p (λ)/ k1 (λ), βR (λ)= R (λ)/ k2 (λ), βS (λ)= S (λ)/ k3 (λ), p (λ)= spectral energy distribution measured for an object, R (λ)=spectral energy distribution measured on a reference surface, S (λ)= spectral energy distribution of the background of object).