HIGH-TEMPERATURE DIELECTRIC PROPERTY MEASURING APPARATUS

PURPOSE: To provide a high-temperature dielectric property measuring apparatus which can accurately calibrate a transmission line at a high temperature, measure the thickness of a material under test and simultaneously measure the dielectric properties in the high-temperature dielectric property mea...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	ENDOU MASAMORI
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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