HIGH-TEMPERATURE DIELECTRIC PROPERTY MEASURING APPARATUS

PURPOSE: To provide a high-temperature dielectric property measuring apparatus which can accurately calibrate a transmission line at a high temperature, measure the thickness of a material under test and simultaneously measure the dielectric properties in the high-temperature dielectric property measurement by a free space S parameter method. CONSTITUTION: An apparatus for measuring high-temperature dielectric properties from the reflecting or absorbing characteristics of the microwave of a material 10 under test in a heating furnace 6 by installing the furnace 6 at the intermediate between a horn lens antenna 4 for transmitting and a horn lens antenna 5 for receiving to be disposed oppositely comprises a mobile stage 8 for setting the material 10 under test provided at the bottom of the furnace 6 by a material-under-test clamp 11 to be movable in the microwave transmitting direction, a movable metal plate 12 vertically tiltably disposed as high temperature remains on the stage 8, and optical position-sensors 15, 16 installed out of the furnace oppositely to the through hole 14 opened at the microwave transmitting wall 7 of the furnace 6.