METHOD FOR MEASURING CRYSTAL STATE OF SYNTHETIC RESIN FILM

PURPOSE: To measure the crystal state of a synthetic resin film every moment using an X-ray diffraction unit. CONSTITUTION: A preheated metal plate 3 and synthetic resin films 4, 4 are passed simultaneously through the pressure contact part 2 of laminate rolls 1, 1 held at a constant temperature thu...

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Bibliographische Detailangaben
Hauptverfasser:	IKEJIRI MUNEO, IKEDAKA SEI, HARADA HIROYUKI
Format:	Patent
Sprache:	eng
Schlagworte:	AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING INDEXING SCHEME ASSOCIATED WITH SUBCLASS B29C, RELATING TO PARTICULARARTICLES INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES LAYERED PRODUCTS LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT ORNON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM MEASURING PERFORMING OPERATIONS PHYSICS SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDEDFOR SHAPING OR JOINING OF PLASTICS TESTING TRANSPORTING WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
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Beschreibung
Zusammenfassung:	PURPOSE: To measure the crystal state of a synthetic resin film every moment using an X-ray diffraction unit. CONSTITUTION: A preheated metal plate 3 and synthetic resin films 4, 4 are passed simultaneously through the pressure contact part 2 of laminate rolls 1, 1 held at a constant temperature thus laminating the metal plate 3 and the film 4. The high temperature laminate metal plate 5 is then cooled by a cooler 6 and the crystal state (e.g. biaxial orientation) of a film 7 laminated on the metal plate 5 is measured by an X-ray diffraction unit 8. Output signal 9 from the unit 8 is delivered to a decision unit 10 in order to determine the biaxial orientation of the film 7. With such method, crystal state of a synthetic resin film can be determined every moment.