DEFECT INSPECTING METHOD FOR X-RAY TAKING-OUT WINDOW

PURPOSE: To precisely detect the fine defect of an X-ray taking-out window. CONSTITUTION: When a fine defect 3 is present on the X-ray taking-out window of an X-ray generating chamber 1, an X-ray is emitted to the X-ray taking-out window and an X-ray transmitting structure 4 having a standard patter...

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Bibliographische Detailangaben

1. Verfasser:	SEKIMOTO MISAO
Format:	Patent
Sprache:	eng
Schlagworte:	ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ELECTRICITY X-RAY TECHNIQUE
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