SIGNAL PROCESSOR

PURPOSE: To provide a signal processor which can test signal block corresponding to a plurality of ICs using an existing test pattern when the plurality of ICs are collected into one IC. CONSTITUTION: The signal processor, where a plurality of integrated circuits are collected into one integrated circuit, comprises a plurality of signal processing blocks 2, 5, signal I/O ports, i.e., I/O cells 8, disposed between a plurality of signal processing blocks 2, 5, and an output terminal 11. Since the operation test is carried out for the plurality of signal processing blocks 2, 5 by inputting/outputting the signals through the ports, i.e., the I/O cells 8, and the output terminal, the test can be carried out using an existing pattern and the labor required for collecting the plurality of integrated circuit into one can be saved.