PROTECTOR AND STOCKING METHOD OF PROBE CARD FOR MEASURING SEMICONDUCTOR

PURPOSE: To protect a probe surely at the time of stocking while facilitating the work for fixing/removing a probe to/from an inspection equipment by covering the projecting side of the probe and mounting the probe detachably on a test circuit board through a probe card. CONSTITUTION: At the time of...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	NAGASAKI KENICHI
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!