PROTECTOR AND STOCKING METHOD OF PROBE CARD FOR MEASURING SEMICONDUCTOR

PURPOSE: To protect a probe surely at the time of stocking while facilitating the work for fixing/removing a probe to/from an inspection equipment by covering the projecting side of the probe and mounting the probe detachably on a test circuit board through a probe card. CONSTITUTION: At the time of...

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1. Verfasser:	NAGASAKI KENICHI
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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creator	NAGASAKI KENICHI
description	PURPOSE: To protect a probe surely at the time of stocking while facilitating the work for fixing/removing a probe to/from an inspection equipment by covering the projecting side of the probe and mounting the probe detachably on a test circuit board through a probe card. CONSTITUTION: At the time of stocking a probe card, a protector 9 made of transparent acryl is fixed to the probe card on the projecting face side of probe (lower surface side). The protector 9 has a recess 9a for receiving and protecting a probe 8. The protector 9 is secured by passing two knurled screws 10 through insertion holes 11 made oppositely at the outer fringe part of the protector 9 and insertion holes 12 of the probe card 7 and then screwing the screws 10 into threaded holes 13 of a DUT board 5. Consequently, the protector 9 of probe card 7 can be mounted or removed easily by tightening or loosening the decoration screws 10 without requiring any tool, e.g. a screw driver.
format	Patent
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CONSTITUTION: At the time of stocking a probe card, a protector 9 made of transparent acryl is fixed to the probe card on the projecting face side of probe (lower surface side). The protector 9 has a recess 9a for receiving and protecting a probe 8. The protector 9 is secured by passing two knurled screws 10 through insertion holes 11 made oppositely at the outer fringe part of the protector 9 and insertion holes 12 of the probe card 7 and then screwing the screws 10 into threaded holes 13 of a DUT board 5. 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CONSTITUTION: At the time of stocking a probe card, a protector 9 made of transparent acryl is fixed to the probe card on the projecting face side of probe (lower surface side). The protector 9 has a recess 9a for receiving and protecting a probe 8. The protector 9 is secured by passing two knurled screws 10 through insertion holes 11 made oppositely at the outer fringe part of the protector 9 and insertion holes 12 of the probe card 7 and then screwing the screws 10 into threaded holes 13 of a DUT board 5. Consequently, the protector 9 of probe card 7 can be mounted or removed easily by tightening or loosening the decoration screws 10 without requiring any tool, e.g. a screw driver.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1996</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHAPCPIPcXUO8Q9ScPRzUQgO8Xf29vRzV_B1DfHwd1Hwd1MAKnByVXB2DHJRcAOq8nV1DA4NAikJdvX1dPb3cwkF6eZhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfFeAR4GFoYmFqbGpo7GxKgBAOUhLOQ</recordid><startdate>19960607</startdate><enddate>19960607</enddate><creator>NAGASAKI KENICHI</creator><scope>EVB</scope></search><sort><creationdate>19960607</creationdate><title>PROTECTOR AND STOCKING METHOD OF PROBE CARD FOR MEASURING SEMICONDUCTOR</title><author>NAGASAKI KENICHI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JPH08148535A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1996</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>NAGASAKI KENICHI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>NAGASAKI KENICHI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>PROTECTOR AND STOCKING METHOD OF PROBE CARD FOR MEASURING SEMICONDUCTOR</title><date>1996-06-07</date><risdate>1996</risdate><abstract>PURPOSE: To protect a probe surely at the time of stocking while facilitating the work for fixing/removing a probe to/from an inspection equipment by covering the projecting side of the probe and mounting the probe detachably on a test circuit board through a probe card. CONSTITUTION: At the time of stocking a probe card, a protector 9 made of transparent acryl is fixed to the probe card on the projecting face side of probe (lower surface side). The protector 9 has a recess 9a for receiving and protecting a probe 8. The protector 9 is secured by passing two knurled screws 10 through insertion holes 11 made oppositely at the outer fringe part of the protector 9 and insertion holes 12 of the probe card 7 and then screwing the screws 10 into threaded holes 13 of a DUT board 5. Consequently, the protector 9 of probe card 7 can be mounted or removed easily by tightening or loosening the decoration screws 10 without requiring any tool, e.g. a screw driver.</abstract><edition>6</edition><oa>free_for_read</oa></addata></record>
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subjects	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
title	PROTECTOR AND STOCKING METHOD OF PROBE CARD FOR MEASURING SEMICONDUCTOR
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