METHOD FOR MEASURING SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE

PURPOSE: To measure an IC in a state which is close to the practical application of the IC. CONSTITUTION: When the output voltage of an output buffer circuit 3 becomes an 'H' level, an output current i20-1 flows from the circuit 3 and an electric current i2l-1 flows to the grounding potent...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	KONO HARUMI
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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