METHOD FOR MEASURING SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE

PURPOSE: To measure an IC in a state which is close to the practical application of the IC. CONSTITUTION: When the output voltage of an output buffer circuit 3 becomes an 'H' level, an output current i20-1 flows from the circuit 3 and an electric current i2l-1 flows to the grounding potential of a TTL 21. When the current i2l-1 flows to the ground potential, a voltage drop occurs across a transmission line 4 and the potential at the transmission lines becomes lower than a power supply voltage VDD. When the output voltage of the circuit 3 becomes 'L' level, the voltage across the line 4 becomes higher than the grounding potential (0V), because an electric current flows to the circuit 3 from the power supply potential of the TTL 21. As a result, the voltage amplitude of the line 4 becomes smaller than 0V-VDD. A load capacity 6 performs charging and discharging in a state which is close to an actual using state. A measuring instrument 5 measures the functional operations of an IC2 by measuring the output voltage or output current of the circuit 3 at prescribed timing.