PROGRAMMABLE WIRING CIRCUIT AND TEST BOARD DEVICE

PURPOSE: To remove influence of a wiring delay, raise the degree of freedom of a wiring and contrive to enhance use efficiency by a method wherein a bypass wiring has beforehand been arranged so that a various-purpose wiring is bypassed every predetermined length. CONSTITUTION: Input and output terminals 12 are regularly arranged on a semiconductor chip 11. Input and output lines 13 for transmitting or receiving data between the input and output terminals 12 and a wiring path within a chip are arranged with respect to these input and output terminals 12, respectively. Various-purpose wires 14, 15 are formed in the semiconductor chip 11 to form an optical wiring path. Further, bypass wires 16, 17 for bypassing these various-purpose wires 14, 15 every predetermined length are arranged. A wiring connection point 18 is arranged in an array-like form in each intersecting point location of the input and output lines 13, the various-purpose wires 14, 15 and the bypass wires 16, 17 and is a program element capable of changing a connection state with respect to each other and controlling a wiring path.