METHOD FOR INSPECTING MOUNTED STATE OF ELECTRONIC PART

PURPOSE:To provide a method capable of quickly and precisely judging whether an electronic part is loaded on a base in a normal posture or not. CONSTITUTION:The heights of a plurality of measuring points (a), (b), (c), (d) in an area in which the presence of an electronic part 2 on a base is predict...

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Bibliographische Detailangaben
1. Verfasser: TOKURA NOBUSHI
Format: Patent
Sprache:eng
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Zusammenfassung:PURPOSE:To provide a method capable of quickly and precisely judging whether an electronic part is loaded on a base in a normal posture or not. CONSTITUTION:The heights of a plurality of measuring points (a), (b), (c), (d) in an area in which the presence of an electronic part 2 on a base is predicted are measured by a height measuring device, and the measurement values are compared with a set value based on the thickness of the electronic part 2 to judge the quality of the mounted state. Since all the measurement values are values approximate to the thickness of the electronic part 2 when the mounted state of the electronic part 2 is normal, the quality can be precisely judged.