SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE

PURPOSE:To conduct screening in a semiconductor integrated circuit device provided with a RAM or a logic circuit in a short time and surely only by impressing source voltage. CONSTITUTION:A pattern generator 1 is constituted of a ring oscillator 2 and a frequency divider 3 dividing pulse signals. Th...

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Hauptverfasser: IWABUCHI MASATO, USAMI MASAMI
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:PURPOSE:To conduct screening in a semiconductor integrated circuit device provided with a RAM or a logic circuit in a short time and surely only by impressing source voltage. CONSTITUTION:A pattern generator 1 is constituted of a ring oscillator 2 and a frequency divider 3 dividing pulse signals. The output signal of the frequency divider 3 is input to a latch circuit 4 and, by way of a data input DIN, write definition WE and a decoder 5a, input to an address input. In the data input DIN, pulse signals of 0 and 1 are repeatedly input and in the address input, signals increased from 0 in turn is input, and in the write definition WE, read cycle is input in the beginning half pattern and write cycle signals, in the second half to drive the latch circuit 4 and the RAM 5 in the semiconductor integration circuit device.