APPEARANCE INSPECTOR
PURPOSE:To solve a problem of the life of a camera for inspection being limited by the life of a shutter for interruption of the incidence of light. CONSTITUTION:In an appearance inspector which photographs an object M to be inspected lighted with lighting systems 2 and 3 to inspect with a camera 19...
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | KISHI TAKAAKI |
| description | PURPOSE:To solve a problem of the life of a camera for inspection being limited by the life of a shutter for interruption of the incidence of light. CONSTITUTION:In an appearance inspector which photographs an object M to be inspected lighted with lighting systems 2 and 3 to inspect with a camera 19 for inspection, the lighting systems are provided with a control means 18 to interrupt the irradiation of the object to be inspected with illumination light while the control means is operated in synchronous with a timing of prossing a signal in a solid image sensor of the camera for inspection. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JPH07151695A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JPH07151695A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JPH07151695A3</originalsourceid><addsrcrecordid>eNrjZBBxDAhwdQxy9HN2VfD0Cw5wdQ7xD-JhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfFeAR4G5oamhmaWpo7GxKgBAIOjHug</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>APPEARANCE INSPECTOR</title><source>esp@cenet</source><creator>KISHI TAKAAKI</creator><creatorcontrib>KISHI TAKAAKI</creatorcontrib><description>PURPOSE:To solve a problem of the life of a camera for inspection being limited by the life of a shutter for interruption of the incidence of light. CONSTITUTION:In an appearance inspector which photographs an object M to be inspected lighted with lighting systems 2 and 3 to inspect with a camera 19 for inspection, the lighting systems are provided with a control means 18 to interrupt the irradiation of the object to be inspected with illumination light while the control means is operated in synchronous with a timing of prossing a signal in a solid image sensor of the camera for inspection.</description><edition>6</edition><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; SEMICONDUCTOR DEVICES ; TESTING</subject><creationdate>1995</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19950616&DB=EPODOC&CC=JP&NR=H07151695A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19950616&DB=EPODOC&CC=JP&NR=H07151695A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KISHI TAKAAKI</creatorcontrib><title>APPEARANCE INSPECTOR</title><description>PURPOSE:To solve a problem of the life of a camera for inspection being limited by the life of a shutter for interruption of the incidence of light. CONSTITUTION:In an appearance inspector which photographs an object M to be inspected lighted with lighting systems 2 and 3 to inspect with a camera 19 for inspection, the lighting systems are provided with a control means 18 to interrupt the irradiation of the object to be inspected with illumination light while the control means is operated in synchronous with a timing of prossing a signal in a solid image sensor of the camera for inspection.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1995</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBBxDAhwdQxy9HN2VfD0Cw5wdQ7xD-JhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfFeAR4G5oamhmaWpo7GxKgBAIOjHug</recordid><startdate>19950616</startdate><enddate>19950616</enddate><creator>KISHI TAKAAKI</creator><scope>EVB</scope></search><sort><creationdate>19950616</creationdate><title>APPEARANCE INSPECTOR</title><author>KISHI TAKAAKI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JPH07151695A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1995</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>KISHI TAKAAKI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KISHI TAKAAKI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>APPEARANCE INSPECTOR</title><date>1995-06-16</date><risdate>1995</risdate><abstract>PURPOSE:To solve a problem of the life of a camera for inspection being limited by the life of a shutter for interruption of the incidence of light. CONSTITUTION:In an appearance inspector which photographs an object M to be inspected lighted with lighting systems 2 and 3 to inspect with a camera 19 for inspection, the lighting systems are provided with a control means 18 to interrupt the irradiation of the object to be inspected with illumination light while the control means is operated in synchronous with a timing of prossing a signal in a solid image sensor of the camera for inspection.</abstract><edition>6</edition><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng |
| recordid | cdi_epo_espacenet_JPH07151695A |
| source | esp@cenet |
| subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS SEMICONDUCTOR DEVICES TESTING |
| title | APPEARANCE INSPECTOR |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-24T05%3A23%3A58IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=KISHI%20TAKAAKI&rft.date=1995-06-16&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJPH07151695A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |