APPEARANCE INSPECTOR

PURPOSE:To solve a problem of the life of a camera for inspection being limited by the life of a shutter for interruption of the incidence of light. CONSTITUTION:In an appearance inspector which photographs an object M to be inspected lighted with lighting systems 2 and 3 to inspect with a camera 19...

Ausführliche Beschreibung

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Bibliographische Detailangaben
1. Verfasser:	KISHI TAKAAKI
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS SEMICONDUCTOR DEVICES TESTING
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Beschreibung
Zusammenfassung:	PURPOSE:To solve a problem of the life of a camera for inspection being limited by the life of a shutter for interruption of the incidence of light. CONSTITUTION:In an appearance inspector which photographs an object M to be inspected lighted with lighting systems 2 and 3 to inspect with a camera 19 for inspection, the lighting systems are provided with a control means 18 to interrupt the irradiation of the object to be inspected with illumination light while the control means is operated in synchronous with a timing of prossing a signal in a solid image sensor of the camera for inspection.