METHOD OF INSPECTING IMAGE

PURPOSE:To obtain a method for detecting highly precisely a flaw formed in a uniform surface, a stain thereon and the like. CONSTITUTION:A method for inspecting a flaw, a stain and the like of a uniform surface, wherein a camera 1 for measuring the luminance of the surface, a memory 3 for storing the luminance of the surface and a memory 4 for storing the luminance of a surface located at a somewhat different position from the surface stored in the memory 3 are provided and wherein a difference between the luminances stored in the memories 3 and 4 is calculated and a spot whereat the calculated value exceeds an allowable value set beforehand is judged to be the flaw, the stain or the like. Accordingly, the flaw, the stain and the like of the surface whereon the luminance changes gently can be detected, it is unnecessary to set a reference value beforehand, a set value of the flaw, the stain or the like can be made small and, therefore, the flaw, the stain and the like can be detected highly precisely.