DEVICE FOR REMOVING AN ATTACHMENT FROM PLASTIC WASTE CHECKING PROBE

PURPOSE:To shorten time required until checking a following object to be checked is possible by providing a member which comes in contact with the tip of a thermal needle and scrapes off an attachment after the thermal needle leaves the object, in a device for allowing the thermal needle to come in...

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Bibliographische Detailangaben
Hauptverfasser: HASEGAWA HIROMI, HAMA TOSHIO, HIRATA NAOKO, SHIOZAKI HIDEKI, FUJITA JINSHIRO, MATSUOKA KIICHI, TERADA YUKIHIRO, KINOSHITA MASAO, NAGAI KENICHI
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:PURPOSE:To shorten time required until checking a following object to be checked is possible by providing a member which comes in contact with the tip of a thermal needle and scrapes off an attachment after the thermal needle leaves the object, in a device for allowing the thermal needle to come in contact with plastic waste and checking generated heat cracking gas. CONSTITUTION:A main probe system is equipped internally with a thermal needle 2 and a contact adjustment ring 3 which slides in a freely recedable manner into the tip inner side through a compression spring 4. In addition, a scraping plate 5 is provided on the inner surface of the contact adjustment ring 3. This construction is, for example, such that small blade pieces are partially stacked over the other like a camera stop to/form a through hole 6 in the center. If the ring 3 recedes into the main probe system 1 after coming in contact with an object to be checked, the through hole 6 becomes enlarged and the thermal needle 2 comes in contact with the object through the through hole 6. After checkup operation, the through hole 6 is narrowed and a hole edge part scrapes an attachment off the thermal needle 2, if the thermal needle 2 leaves the object. A heat cracking gas is sent to an HCl detector.