DRY PROCESS ANALYSIS FILM PIECE WITH SUBSTRATE

PURPOSE:To positively carry a dry process analysis film and obtain a dry process analysis element which can further miniaturize an analysis device by maintaining flatness while keeping the dry process analysis film piece to be nearly in the same size in a dry process analysis film analyzer. CONSTITU...

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Bibliographische Detailangaben
Hauptverfasser:	FUJISAKI TAIJI, TSURUTA HIKARI, SESHIMOTO OSAMU
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	PURPOSE:To positively carry a dry process analysis film and obtain a dry process analysis element which can further miniaturize an analysis device by maintaining flatness while keeping the dry process analysis film piece to be nearly in the same size in a dry process analysis film analyzer. CONSTITUTION:A dry process analysis film piece 1 with a substrate consists of a dry process analysis film piece 2 and a substrate 3. The dry process analysis film piece 2 and the substrate 3 are subjected to ultrasonic adhesion near four corners (an adhesion part a) and are sealed. The substrate 3 is formed by plastic and is rigid enough to maintain the flatness of the dry process analysis film piece 2. A hole 4 for photometry for enabling light to be transmitted on photometry is formed through the center part of the substrate 3.