TESTING METHOD FOR LASER DIODE

PURPOSE:To provide a method for testing a laser diode in which the number of testing steps of a code error ratio is reduced and an efficiency of testing is enhanced in the method for testing the rate of the diode. CONSTITUTION:A test of a laser diode before a code error ratio is measured obtains the...

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1. Verfasser:	KOIZUMI MIKIO
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS DEVICES USING STIMULATED EMISSION ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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Beschreibung
Zusammenfassung:	PURPOSE:To provide a method for testing a laser diode in which the number of testing steps of a code error ratio is reduced and an efficiency of testing is enhanced in the method for testing the rate of the diode. CONSTITUTION:A test of a laser diode before a code error ratio is measured obtains the following formulae by using a measured value of a threshold current (Ith), a bias current (Ib) and a pulse current (Ip). f=ln((alpha-k)/(alpha-1)). alpha=(Ib+Ip)Ith. k=Ib/Ith (k