FORMATION METHOD FOR HOLE STRUCTURE IN SILICON SUBSTRATE

PURPOSE: To form a pore structure with a large aspect ratio whose depth exceeds 20 μm on a silicon-made substrate, irrespective of its hole diameter. CONSTITUTION: A fine hole 4 is provided in order to form a hole structure 6 in an n-doped single crystal silicon-made substrate 1 where the depth of t...

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Hauptverfasser: UORUFUGANGU HENRAIN, FUORUKAA REEMAN, YOOZEFU UIRAA
Format: Patent
Sprache:eng
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Zusammenfassung:PURPOSE: To form a pore structure with a large aspect ratio whose depth exceeds 20 μm on a silicon-made substrate, irrespective of its hole diameter. CONSTITUTION: A fine hole 4 is provided in order to form a hole structure 6 in an n-doped single crystal silicon-made substrate 1 where the depth of the fine hole 4 is equivalent to that of the hole structure 6 which starts from a first main surface 2 by electric chemical etching on the substrate. There is formed a mask which segments the cross section of the hole structure 6 in parallel to the first main surface. The hole structure 6 is formed by removing the silicon which forms the side wall of the fine hole 4 that is not covered with the mask, through the use of selective etching of the mask.