SURFACE CONTAMINATION INSPECTING APPARATUS
PURPOSE:To enhance smear inspection speed by employing a plurality of smear arms for smearing a wide area simultaneously and transferring a specimen such that the waiting time for smear table is shortened. CONSTITUTION:A plurality of specimens 2 are transferred sequentially on a transfer conveyor 1...
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creator | TAKAHASHI MOTOMU |
description | PURPOSE:To enhance smear inspection speed by employing a plurality of smear arms for smearing a wide area simultaneously and transferring a specimen such that the waiting time for smear table is shortened. CONSTITUTION:A plurality of specimens 2 are transferred sequentially on a transfer conveyor 1 onto a smear table 11. A smear control section 12 controls the smear table 11 and a plurality of smear arms 5 to rotate the specimen 2 and the arms 5 relatively thus smearing the specimen 2 by means of a filter paper 5a at the tip of the arm. A transfer control section 13 controls the conveyor 1 so that a smeared specimen 2 is transferred onto a measurement waiting table 14 and a next specimen 2 is transferred onto the smear table 11. On the other hand, a measurement control section 15 removes the filter paper 5a from each smear arm 5 and measures radiation dose while a contamination detector 7 checks contamination on the surface of the specimen 2. A transfer conveyor 8 is then controlled to transfer the specimen 2 from the waiting table 14 to other place depending on the check result. |
format | Patent |
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CONSTITUTION:A plurality of specimens 2 are transferred sequentially on a transfer conveyor 1 onto a smear table 11. A smear control section 12 controls the smear table 11 and a plurality of smear arms 5 to rotate the specimen 2 and the arms 5 relatively thus smearing the specimen 2 by means of a filter paper 5a at the tip of the arm. A transfer control section 13 controls the conveyor 1 so that a smeared specimen 2 is transferred onto a measurement waiting table 14 and a next specimen 2 is transferred onto the smear table 11. On the other hand, a measurement control section 15 removes the filter paper 5a from each smear arm 5 and measures radiation dose while a contamination detector 7 checks contamination on the surface of the specimen 2. 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A transfer conveyor 8 is then controlled to transfer the specimen 2 from the waiting table 14 to other place depending on the check result.</description><subject>MEASUREMENT OF NUCLEAR OR X-RADIATION</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1994</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNAKDg1yc3R2VXD29wtx9PX0cwzx9PdT8PQLDnB1DvH0c1dwDAhwDHIMCQ3mYWBNS8wpTuWF0twMCm6uIc4euqkF-fGpxQWJyal5qSXxXgEeBmZG5kYmxo7GRCgBADEpJMM</recordid><startdate>19940204</startdate><enddate>19940204</enddate><creator>TAKAHASHI MOTOMU</creator><scope>EVB</scope></search><sort><creationdate>19940204</creationdate><title>SURFACE CONTAMINATION INSPECTING APPARATUS</title><author>TAKAHASHI MOTOMU</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JPH0627243A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1994</creationdate><topic>MEASUREMENT OF NUCLEAR OR X-RADIATION</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>TAKAHASHI MOTOMU</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>TAKAHASHI MOTOMU</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SURFACE CONTAMINATION INSPECTING APPARATUS</title><date>1994-02-04</date><risdate>1994</risdate><abstract>PURPOSE:To enhance smear inspection speed by employing a plurality of smear arms for smearing a wide area simultaneously and transferring a specimen such that the waiting time for smear table is shortened. CONSTITUTION:A plurality of specimens 2 are transferred sequentially on a transfer conveyor 1 onto a smear table 11. A smear control section 12 controls the smear table 11 and a plurality of smear arms 5 to rotate the specimen 2 and the arms 5 relatively thus smearing the specimen 2 by means of a filter paper 5a at the tip of the arm. A transfer control section 13 controls the conveyor 1 so that a smeared specimen 2 is transferred onto a measurement waiting table 14 and a next specimen 2 is transferred onto the smear table 11. On the other hand, a measurement control section 15 removes the filter paper 5a from each smear arm 5 and measures radiation dose while a contamination detector 7 checks contamination on the surface of the specimen 2. A transfer conveyor 8 is then controlled to transfer the specimen 2 from the waiting table 14 to other place depending on the check result.</abstract><edition>5</edition><oa>free_for_read</oa></addata></record> |
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subjects | MEASUREMENT OF NUCLEAR OR X-RADIATION MEASURING PHYSICS TESTING |
title | SURFACE CONTAMINATION INSPECTING APPARATUS |
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