MEASURING DEVICE

PURPOSE:To provide a resistance value of an analog part mounted on highly precise wiring board by correcting change in resistance due to deterioration with the lays of time in a contact part and in a signal cable. CONSTITUTION:Measurement of a resistance value of an analog part 15 is carried out by...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: KOMORI SHOICHI, ISHIYAMA TAKASHI, KAWAGUCHI YOSHIHITO, SATO YOSHIO
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:PURPOSE:To provide a resistance value of an analog part mounted on highly precise wiring board by correcting change in resistance due to deterioration with the lays of time in a contact part and in a signal cable. CONSTITUTION:Measurement of a resistance value of an analog part 15 is carried out by inputting test data to a measurement device 1, impressing an input pattern 11 among the test data from a measurement execution part 6 to the analog part 15 via a signal cable and a contact part 14 between the analog part 15 and the signal cable, and taking in the output to the measurement execution part 6. A correction value calculating part 9 calculates a resistance value of the signal cable and the contact part between the analog part 15 and the signal cable considering the deterioration with the lays of time in them on the basis of the predetermined number of past measurement results stored in a memory device 8 previously and the predetermined algorithm. When the number of the past measurement is less than the predetermined number, the data prepared in a correction value data memory device 17 is used.