ESTIMATING METHOD FOR WIRING LENGTH OF SEMICONDUCTOR INTEGRATED CIRCUIT

PURPOSE:To accurately estimate the wiring length of a semiconductor integrated circuit even in such a case that a large error is included in the estimated wiring length due to large-sized undesigned macros when the estimated wiring length is found at the time of performing the floor planning of an L...

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Bibliographische Detailangaben
1. Verfasser: MISHIMA TOMOKO
Format: Patent
Sprache:eng
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