METHOD AND DEVICE FOR CONTROLLING MELTING LEVEL OF MOLTEN MATERIAL IN CRUCIBLE

The invention relates to a process and a device for carrying this out by which precise and simple control of the melt level can be achieved during pulling of single crystals by the Czochralski method. The process comprises that a mechanical reference marker is mounted above the melt in such a way th...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	KURISUTEIAN HOFUSUTETAA, BUARUTAA BERUGAA, BUERUNAA BAUAA, BERUNTO MITSUTERUBATSUHA
Format:	Patent
Sprache:	eng
Schlagworte:	AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUSPOLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE APPARATUS THEREFOR CHEMISTRY CRYSTAL GROWTH MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS METALLURGY PHYSICS PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITHDEFINED STRUCTURE REFINING BY ZONE-MELTING OF MATERIAL SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITHDEFINED STRUCTURE SINGLE-CRYSTAL-GROWTH TESTING UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL ORUNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL
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Beschreibung
Zusammenfassung:	The invention relates to a process and a device for carrying this out by which precise and simple control of the melt level can be achieved during pulling of single crystals by the Czochralski method. The process comprises that a mechanical reference marker is mounted above the melt in such a way that a reflection is caused on the melt surface. An image of the melt surface is then recorded and with the aid of the recorded image the distance of the mechanical reference marker to the melt surface is determined. An actual value signal proportional to this distance is then generated, compared with a preset signal, and the melt height is changed in relation to a determined difference.