DEVICE AND METHOD FOR EVALUATION OF SURFACE AND INSIDE QUALITIES OF METAL MATERIAL

PURPOSE:To obtain the device and method for making possible precise observation and rapid evaluation by lumping a wide range together when the surface and inside quality of a metal material are evaluated. CONSTITUTION:An image reading device 1 composed of a linear sensor camera 2, a high-frequency l...

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Hauptverfasser:	MATSUDA KIYOSHI, KAKUHARI TORU, MAEDE HIROFUMI, ISOBE KOICHI, NOMURA KAZUHARU
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC COMMUNICATION TECHNIQUE ELECTRICITY IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS PICTORIAL COMMUNICATION, e.g. TELEVISION TESTING
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Beschreibung
Zusammenfassung:	PURPOSE:To obtain the device and method for making possible precise observation and rapid evaluation by lumping a wide range together when the surface and inside quality of a metal material are evaluated. CONSTITUTION:An image reading device 1 composed of a linear sensor camera 2, a high-frequency line light source 5, a stage for movement 3 and a stage controller 4, the position relation of the linear sensor camera 2, the high- frequency line light source 5 and a sample surface is properly arranged by the use of an image processor 6, an image analyzer 7, a main computer for operation 8 and a device composed of the other peripheral devises. Thereby observation image data are directly taken out from the surface of a sample of a metal material, with image analysis in addition to image processing added, rapid and precise observation and evaluation over the wide area of the surface quality of the metal material and the inside quality thereof such as structure and segregation are performed.