FUNCTION TRIMMING METHOD FOR HYBRID INTEGRATED CIRCUIT

PURPOSE:To shorten a trimming time by making a cutting amount greater when the measuring value of characteristics is greatly deviated from a target value and making it increasingly smaller as the deviation becomes smaller. CONSTITUTION:When a characteristic value is adjusted by cutting the intermedi...

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1. Verfasser: KOIKE AKITO
Format: Patent
Sprache:eng
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Zusammenfassung:PURPOSE:To shorten a trimming time by making a cutting amount greater when the measuring value of characteristics is greatly deviated from a target value and making it increasingly smaller as the deviation becomes smaller. CONSTITUTION:When a characteristic value is adjusted by cutting the intermediate part of the electrodes 13 and 14 of the adjusting resistor 12 in the direction indicated by a line 15 for a hybrid integrated circuit 2, the characteristic value C is measured, the difference between the characteristic value C and a target value CG is obtained, and the product of such a difference multiplied by the rate of change DELTAC of the characteristic value is defined as the next cutting amount. In other words, if the difference between the target value CG and the measured value C is great, the cutting amount L is made larger. If the difference is small, the cutting amount is made smaller so that no over cutting will ensue. Therefore, compared to a case where a cutting is executed each by a cutting amount of DELTAL from the beginning so as not to create any over cutting, the number of cuttings and that of measurements are curtailed to shorten the time required for trimming.