PATTERN RECOGNITION SYSTEM FOR DETECTING RELATIVE HEIGHT AND RECOGNIZING PATTERN

PURPOSE:To offer a pattern recognition system making it unnecessary to previously register a master pattern in each recognition object and capable of easily recognizing the external appearance of the recognition object irrespective of the light reflection intensity of the recognition object and that...

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Bibliographische Detailangaben
Hauptverfasser:	HASHIMOTO YUTAKA, TAKAOKA ISAMU
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING HANDLING RECORD CARRIERS IMAGE DATA PROCESSING OR GENERATION, IN GENERAL MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS PRESENTATION OF DATA RECOGNITION OF DATA RECORD CARRIERS TESTING
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Beschreibung
Zusammenfassung:	PURPOSE:To offer a pattern recognition system making it unnecessary to previously register a master pattern in each recognition object and capable of easily recognizing the external appearance of the recognition object irrespective of the light reflection intensity of the recognition object and that of a background. CONSTITUTION:The pattern recognition system characteristically has a relative height detecting means 8 for measuring the relative height of plural points in each of plural areas on the surface of a recognition object which has a pattern to be recognized and its background, a standard deviation computing means 11 for computing the standard deviation of relative height on plural points in each area, a judging means for judging the inclusion of a boundary between the pattern and the background in the area when the standard deviation is more than a fixed value, and an outline recognizing means 14 for recognizing the outline of the pattern based upon the spatial distribution of the area including the boundary.