JPH05251291

PURPOSE: To produce a stable shelf-life silicon wafer surface having an advanta geous oxidation characteristic by using haloalkyl silane having a chemical formula R x SiR y (OR )4-x-y and haloalkyl disilazane having a chemical formula (R x R 3-x Si)2 NH as an organic silicon reagent. CONSTITUTION: H...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: RASUTSURO FUABURI, DEIITAA GUREEFU, PEETAA YOON, MANFUREETO GURUNDONAA, SUZANNE BAUAA BEIAA
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator RASUTSURO FUABURI
DEIITAA GUREEFU
PEETAA YOON
MANFUREETO GURUNDONAA
SUZANNE BAUAA BEIAA
description PURPOSE: To produce a stable shelf-life silicon wafer surface having an advanta geous oxidation characteristic by using haloalkyl silane having a chemical formula R x SiR y (OR )4-x-y and haloalkyl disilazane having a chemical formula (R x R 3-x Si)2 NH as an organic silicon reagent. CONSTITUTION: Hydrophilic processing using hydrogen peroxide/ammonia is substantially applied to a silicon wafer of which one side is polished in accordance with 'RCA cleaning'. Then the wafer is rinsed and dried and then the organic silicon reagent is applied to the dried wafer. In this case, haloalkyl silane having a chemical formula R x SiR y (OR )4-x-y and haloalkyl disilazane having a chemical formula (R x R 3-x Si)2 NH are used as organic silicon reagent (wherein R is haloalkyl radical, R is alkyl radical, x is an integer of 1 to 3, and y is 0 or 1). Consequently the treated wafer surface can be provided with excellent shelf-life stability.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JPH05251291A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JPH05251291A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JPH05251291A3</originalsourceid><addsrcrecordid>eNrjZOD2CvAwMDUyNTSyNORhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfFIOhyNiVEDADvYG6E</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>JPH05251291</title><source>esp@cenet</source><creator>RASUTSURO FUABURI ; DEIITAA GUREEFU ; PEETAA YOON ; MANFUREETO GURUNDONAA ; SUZANNE BAUAA BEIAA</creator><creatorcontrib>RASUTSURO FUABURI ; DEIITAA GUREEFU ; PEETAA YOON ; MANFUREETO GURUNDONAA ; SUZANNE BAUAA BEIAA</creatorcontrib><description>PURPOSE: To produce a stable shelf-life silicon wafer surface having an advanta geous oxidation characteristic by using haloalkyl silane having a chemical formula R x SiR y (OR )4-x-y and haloalkyl disilazane having a chemical formula (R x R 3-x Si)2 NH as an organic silicon reagent. CONSTITUTION: Hydrophilic processing using hydrogen peroxide/ammonia is substantially applied to a silicon wafer of which one side is polished in accordance with 'RCA cleaning'. Then the wafer is rinsed and dried and then the organic silicon reagent is applied to the dried wafer. In this case, haloalkyl silane having a chemical formula R x SiR y (OR )4-x-y and haloalkyl disilazane having a chemical formula (R x R 3-x Si)2 NH are used as organic silicon reagent (wherein R is haloalkyl radical, R is alkyl radical, x is an integer of 1 to 3, and y is 0 or 1). Consequently the treated wafer surface can be provided with excellent shelf-life stability.</description><edition>5</edition><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>1993</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19930928&amp;DB=EPODOC&amp;CC=JP&amp;NR=H05251291A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19930928&amp;DB=EPODOC&amp;CC=JP&amp;NR=H05251291A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>RASUTSURO FUABURI</creatorcontrib><creatorcontrib>DEIITAA GUREEFU</creatorcontrib><creatorcontrib>PEETAA YOON</creatorcontrib><creatorcontrib>MANFUREETO GURUNDONAA</creatorcontrib><creatorcontrib>SUZANNE BAUAA BEIAA</creatorcontrib><title>JPH05251291</title><description>PURPOSE: To produce a stable shelf-life silicon wafer surface having an advanta geous oxidation characteristic by using haloalkyl silane having a chemical formula R x SiR y (OR )4-x-y and haloalkyl disilazane having a chemical formula (R x R 3-x Si)2 NH as an organic silicon reagent. CONSTITUTION: Hydrophilic processing using hydrogen peroxide/ammonia is substantially applied to a silicon wafer of which one side is polished in accordance with 'RCA cleaning'. Then the wafer is rinsed and dried and then the organic silicon reagent is applied to the dried wafer. In this case, haloalkyl silane having a chemical formula R x SiR y (OR )4-x-y and haloalkyl disilazane having a chemical formula (R x R 3-x Si)2 NH are used as organic silicon reagent (wherein R is haloalkyl radical, R is alkyl radical, x is an integer of 1 to 3, and y is 0 or 1). Consequently the treated wafer surface can be provided with excellent shelf-life stability.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1993</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZOD2CvAwMDUyNTSyNORhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfFIOhyNiVEDADvYG6E</recordid><startdate>19930928</startdate><enddate>19930928</enddate><creator>RASUTSURO FUABURI</creator><creator>DEIITAA GUREEFU</creator><creator>PEETAA YOON</creator><creator>MANFUREETO GURUNDONAA</creator><creator>SUZANNE BAUAA BEIAA</creator><scope>EVB</scope></search><sort><creationdate>19930928</creationdate><title>JPH05251291</title><author>RASUTSURO FUABURI ; DEIITAA GUREEFU ; PEETAA YOON ; MANFUREETO GURUNDONAA ; SUZANNE BAUAA BEIAA</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JPH05251291A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1993</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>RASUTSURO FUABURI</creatorcontrib><creatorcontrib>DEIITAA GUREEFU</creatorcontrib><creatorcontrib>PEETAA YOON</creatorcontrib><creatorcontrib>MANFUREETO GURUNDONAA</creatorcontrib><creatorcontrib>SUZANNE BAUAA BEIAA</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>RASUTSURO FUABURI</au><au>DEIITAA GUREEFU</au><au>PEETAA YOON</au><au>MANFUREETO GURUNDONAA</au><au>SUZANNE BAUAA BEIAA</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>JPH05251291</title><date>1993-09-28</date><risdate>1993</risdate><abstract>PURPOSE: To produce a stable shelf-life silicon wafer surface having an advanta geous oxidation characteristic by using haloalkyl silane having a chemical formula R x SiR y (OR )4-x-y and haloalkyl disilazane having a chemical formula (R x R 3-x Si)2 NH as an organic silicon reagent. CONSTITUTION: Hydrophilic processing using hydrogen peroxide/ammonia is substantially applied to a silicon wafer of which one side is polished in accordance with 'RCA cleaning'. Then the wafer is rinsed and dried and then the organic silicon reagent is applied to the dried wafer. In this case, haloalkyl silane having a chemical formula R x SiR y (OR )4-x-y and haloalkyl disilazane having a chemical formula (R x R 3-x Si)2 NH are used as organic silicon reagent (wherein R is haloalkyl radical, R is alkyl radical, x is an integer of 1 to 3, and y is 0 or 1). Consequently the treated wafer surface can be provided with excellent shelf-life stability.</abstract><edition>5</edition><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_JPH05251291A
source esp@cenet
subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
title JPH05251291
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-11T00%3A36%3A20IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=RASUTSURO%20FUABURI&rft.date=1993-09-28&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJPH05251291A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true