JPH05240914

PURPOSE:To make additional preparation of a test pattern easier and to easily perform another simulation using the added test pattern when a detection rate obtained from a simulation does not reach a target value. CONSTITUTION:A simulation executing section 16 obtains simulated results 1c by executi...

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1. Verfasser: SHIRATORI YUKO
Format: Patent
Sprache:eng
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Zusammenfassung:PURPOSE:To make additional preparation of a test pattern easier and to easily perform another simulation using the added test pattern when a detection rate obtained from a simulation does not reach a target value. CONSTITUTION:A simulation executing section 16 obtains simulated results 1c by executing a fault simulation on simulation information loaded from a simulation information loading section 13 by using a test pattern string generated by means of a test pattern generating section 14 and a detection rate discriminating section 18 discriminates whether or not a detection rate 1d calculated from the results 1c by means of a detection rate calculating section 17 reaches a target detection rate stored in a target detection rate storing section 12. The processes from the test pattern generating section 14 to the detection rate discriminating section 18 are repeated until the detection rate reaches the target detection rate.