DETECTOR CIRCUIT

PURPOSE: To obtain a detection circuit avoiding a disadvantageous result requir ing the recovery time of a flip-flop. CONSTITUTION: Pref., a detector circuit 2 for an integrated circuit tester compares an unknown binary signal A with two reference voltages Vr1, Vr2. The outputs of comparators 5, 6 a...

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1. Verfasser: MARUTEIN FUITSUSHIYAA
Format: Patent
Sprache:eng
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Zusammenfassung:PURPOSE: To obtain a detection circuit avoiding a disadvantageous result requir ing the recovery time of a flip-flop. CONSTITUTION: Pref., a detector circuit 2 for an integrated circuit tester compares an unknown binary signal A with two reference voltages Vr1, Vr2. The outputs of comparators 5, 6 are supplied to a (1 to n) decorder 11 and the outputs 12-14 of the decorders are supplied to latch circuits 22-24. These latch circuits are equipped with feedback loops driven by a control signal G and can be operated in a transmission mode or a mode capable of recording all states of the unknown binary signal A on an indicated time window. The outputs, K M, O of the latch circuits 22-24 are supplied to D flip-flops 38-40 for extracting the outputs of the latch circuits 22-24 as samples.