DEVICE FOR CORRECTION OF RECORDING DENSITY

PURPOSE:To enable correction of density to unevenness in thickness of a glaze layer and automatically coping with variation in a resistance value of an element to be performed by a method wherein a control means for correcting applicable energy of a thermal head based on a resistance value in a resi...

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Bibliographische Detailangaben
Hauptverfasser: SASAKI HIDEKAZU, SEYA KEIICHI
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:PURPOSE:To enable correction of density to unevenness in thickness of a glaze layer and automatically coping with variation in a resistance value of an element to be performed by a method wherein a control means for correcting applicable energy of a thermal head based on a resistance value in a resistance value detecting means and a thickness data of the memory glaze layer of a storage means is provided. CONSTITUTION:A recording density-correcting device is composed of a resistance value-measuring part 103 and a recording density-correcting part 104. Then, the correction part 104 is equipped with a ROM 104a wherein a thickness unevenness data N which is preliminarily measured of a glaze layer corresponding to each element of a thermal head, is stored and a controller 104b which generates an unevenness code K corresponding to each element based on a resistance value R from the measuring part 103 and the thickness unevenness data N of the glaze layer. Further, an unevenness code memory 104c which stores a code K generated with the controller 104b, and an LUT(look up table) 104d which inputs a print data D and the unevenness code K of each element and after correction, outputs the print data P, are provided.