MEASUREMENT EQUIPMENT FOR SEMICONDUCTOR DEVICE

PURPOSE:To shorten measurement time so as to improve processing capacity by making comparison between test codes before and after the measurement and omitting a switching process measurement circuits when they are regarded as the same. CONSTITUTION:Based on a test code read from a storage 1, CPU 2 c...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	SAKAZAKI ATSUSHI
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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